期刊论文详细信息
IEICE Electronics Express
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing
article
Shogo Katayama1  Takayuki Nakatani1  Daisuke Iimori1  Misaki Takagi1  Yujie Zhao1  Anna Kuwana1  Keno Sato2  Takashi Ishida2  Toshiyuki Okamoto2  Tamotsu Ichikawa2  Kentaroh Katoh1  Kazumi Hatayama1  Haruo Kobayashi1 
[1] Division of Electronics and Informatics, Gunma University;ROHM Semiconductor
关键词: sine signal generator;    low distortion;    analog device testing;    ATE;    analog filter;   
DOI  :  10.1587/elex.19.20220470
学科分类:电子、光学、磁材料
来源: Denshi Jouhou Tsuushin Gakkai
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【 摘 要 】

This paper proposes a low-distortion sine wave generator using logic circuits and relatively simple analog filter for analog device testing. Our proposed circuit cancels 3rd-order harmonic distortion (HD3) and 5th-order harmonic distortion (HD5) by summing multiple rectangular waveforms of fundamental and higher frequencies. These rectangular waves are generated by appropriately dividing the rectangular wave from a digital automatic test equipment (ATE). The other higher order odd harmonics are removed by the following simple analog low-pass filter (LPF). We have implemented its prototype whose measurement results show the generation of a sine wave with harmonics of less than -95dBc.

【 授权许可】

CC BY   

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