High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

Article

关键词: ROOT-5)R27-DEGREES-O SURFACE OXIDE;    X-RAY-DIFFRACTION;    OXIDATION;    AL2O3;    PHOTOEMISSION;    METALS;    LEED;   

DOI  :  10.1103/PhysRevB.83.125417

来源: SCIE

【 摘 要 】

We have studied the ultrathin aluminum oxide film on NiAl(110) by a combination of high-resolution core-level spectroscopy and density functional theory calculations. Energy-dependent core-level data from the O 1s and Al 2p levels allows for a distinction between oxygen and aluminum atoms residing at the surface or inside the aluminum oxide film. A comparison to calculated core-level binding energies from the recent model by Kresse et al. [Science 308, 1440 (2005)] reveals good agreement with experiment, and the complex spectroscopic signature of the thin Al oxide on NiAl(110) can be explained. Our assignment of a shifted component in the O 1s spectra to oxygen atoms at the surface with a particular Al and oxygen coordination may have implications for the interpretation of photoelectron-diffraction experiments from similar ultrathin aluminum oxide films.

【 授权许可】

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