Structural contribution to the ferroelectric fatigue in lead zirconate titanate ceramics

Article

关键词: X-RAY-DIFFRACTION;    POLARIZATION FATIGUE;    THIN-FILMS;    CAPACITORS;    SCENARIOS;    MODEL;   

DOI  :  10.1103/PhysRevB.90.094113

来源: SCIE

【 摘 要 】

Many ferroelectric devices are based on doped lead zirconate titanate (PZT) ceramics with compositions near the morphotropic phase boundary (MPB), at which the relevant material's properties approach their maximum. Based on a synchrotron x-ray diffraction study of MPB PZT, bulk fatigue is unambiguously found to arise from a less effective field induced tetragonal-to-monoclinic transformation, at which the degradation of the polarization flipping is detected by a less intense and more diffuse anomaly in the atomic displacement parameter of lead. The time dependence of the ferroelectric response on a structural level down to 250 mu s confirms this interpretation in the time scale of the piezolectric strain response.

【 授权许可】

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