期刊论文详细信息
Dynamical bistability in quantum-dot structures: Role of Auger processes
Article
关键词: FIELD-EFFECT TRANSISTOR;    CARRIER CAPTURE;    STORAGE;   
DOI  :  10.1103/PhysRevB.66.165429
来源: SCIE
【 摘 要 】

Bistability in quantum-dot structures is examined by a drift-diffusion model in combination with electron capture and emission processes. Our simulations provide a dynamic scenario with extremely long switching times of the order of months and the results are in good agreement with the experimental findings of Yusa and Sakaki [Appl. Phys. Lett. 70, 345 (1997)]. The analysis of the data supports the importance of Auger capture processes for quantum dots.

【 授权许可】

Free   

  文献评价指标  
  下载次数:0次 浏览次数:7次