Unusual x-ray excited luminescence spectra of NiO suggest self-trapping of the d-d charge-transfer exciton

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关键词: ELECTRONIC-STRUCTURE;    OPTICAL PROPERTIES;    ELECTROREFLECTANCE;    SEMICONDUCTORS;    EXCITATIONS;    IMPURITIES;    OXIDES;   

DOI  :  10.1103/PhysRevB.86.115128

来源: SCIE

【 摘 要 】

Luminescence spectra of NiO have been investigated under vacuum ultraviolet (VUV) and soft x-ray (XUV) excitation (DESY, Hamburg). Photoluminescence (PL) spectra show broad emission violet and green bands centered at about 3.2 and 2.6 eV, respectively. The PL excitation (PLE) spectral evolution and lifetime measurements reveal that the two mechanisms with short and long decay times, attributed to the d(e(g))-d(e(g)) and p(pi)-d charge transfer (CT) transitions in the range 4-6 eV, respectively, are responsible for the observed emissions. The XUV excitation makes it possible to avoid the predominant role of the surface effects in luminescence and reveals a bulk violet luminescence with a puzzling well-isolated doublet of very narrow lines. These lines with close energies near 3.3 eV are attributed to recombination transitions in the self-trapped d-d CT excitons formed by the coupled Jahn-Teller Ni+ and Ni3+ centers. The conclusion is supported by a comparative analysis of the luminescence spectra for NiO and solid solution NixZn1-xO and by a comprehensive cluster model assignment of different p-d and d-d CT transitions and their relaxation channels. Our paper shows that the time-resolved luminescence measurements provide an instructive tool for the elucidation of the p-d and d-d CT excitations and their relaxation in 3d oxides.

【 授权许可】

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