Long term experimental verification of a single chip quantum random number generator fabricated on the InP platform

EPJ Quantum Technology

Research

Juan Carlos Garcia-Escartin¹  Valentina Moskalenko²  Marcos Troncoso-Costas³  Themistoklis Chrysostomidis⁴  Ioannis Roumpos⁴  Konstantinos Vyrsokinos⁴  David Alvarez Outerelo⁵  Francisco J. Diaz-Otero⁵ 

[1] Dpto. Teoría de la Señal y Comunicaciones e Ingeniería Telemática, University of Valladolid, Campus Miguel Delibes, Paseo Belén n°15, 47011, Valladolid, Spain;Keysight Technologies, Santa Clara, CA, USA;School of Electronic Engineering, Dublin City University, Glasnevin, Dublin 9, Ireland;School of Physics, Aristotle University of Thessaloniki, 54124, Thessaloniki, Greece;atlanTTic Research Center, University of Vigo, El Telecommunication, Campus Universitario s/n, 36310, Vigo, Spain;

关键词: Quantum random number generator;    InP platform;    Integrated optics;    Integrated quantum devices;   

DOI  :  10.1140/epjqt/s40507-023-00162-5

 received in 2022-11-30, accepted in 2023-02-07,  发布年份 2023

来源: Springer

【 摘 要 】

This work presents the results from the experimental evaluation of a quantum random number generator circuit over a period of 300 minutes based on a single chip fabricated on the InP platform. The circuit layout contains a gain switched laser diode (LD), followed by a balanced Mach Zehnder Interferometer for proper light power distribution to the two arms of an unbalanced MZI incorporating a 65.4 mm long spiral waveguide that translates the random phase fluctuations to power variations. The LD was gain-switched at 1.3 GHz and the chip delivered a min-entropy of 0.5875 per bit after removal of the classical noise, resulting a total aggregate bit rate of 6.11 Gbps. The recoded data set successfully passed the 15-battery test NIST statistical test suite for all data sets.

【 授权许可】

CC BY   
© The Author(s) 2023

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