Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy

Beilstein Journal of Nanotechnology

article

Kerstin Neuhaus¹  Christina Schmidt¹  Liudmila Fischer²  Wilhelm Albert Meulenberg²  Ke Ran⁴  Joachim Mayer⁴  Stefan Baumann² 

[1] Forschungszentrum Jülich GmbH, Institute of Energy and Climate Research 12, Helmholtz-Institute Münster: Ionics in Energy Storage;Forschungszentrum Jülich GmbH, Institute of Energy and Climate Research;Faculty of Science and Technology, Inorganic Membranes, University of Twente;Central Facility for Electron Microscopy GFE, RWTH Aachen University;Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons ER-C

关键词: ceria;    diffusion coefficient;    Kelvin probe force microscopy;    oxygenpermeation;   

DOI  :  10.3762/bjnano.12.102

学科分类：环境监测和分析

来源: Beilstein - Institut zur Foerderung der Chemischen Wissenschaften

【 摘 要 】

In this study, a dual phase composite (CSO-FC2O) consisting of 60 vol % Ce0.8Sm0.2O1.9 as oxygen-conductive phase and40 vol % FeCo2O4 as electron-conductive phase was synthesized. TEM measurements showed a relatively pure dual-phase material with only minor amounts of a tertiary (Sm,Ce)(Fe,Co)O3 perovskite phase and isolated residues of a rock salt phase at the grainboundaries. The obtained material was used as a model to demonstrate that a combination of polarization relaxation measurementsand Kelvin probe force microscopy (KPFM)-based mapping of the Volta potential before and after the end of polarization can beused to determine the chemical diffusion coefficient of the ceria component of the composite. The KPFM measurements were performed at room temperature and show diffusion coefficients in the range of 3 × 10−13 cm2·s−1, which is comparable to valuesmeasured for single-phase Gd-doped ceria thin films using the same method.

【 授权许可】

CC BY