Contour feature identification of metal microstructures

Results in Materials

Zhibo Wang¹ 

[1] Jiangsu University of Science and Technology, Zhangjiagang, China;

关键词: Metallographic diagram;    Contour;    Binarizing;    Statistics;   

DOI  :  

来源: DOAJ

【 摘 要 】

A method of calculating the outline of metallographic diagram and statistical outline shape features such as area and slenderness ratio is introduced to reflect the influence of different process parameters on the microstructure of metals. After binarizing the image, the model of similarity matrix is established to describe the overall similarity of the lattice growth and detect possible anomalies for the microstructures with uniform lattice growth and good connectivity. By comparing the statistical values of the outline characteristics of the crystal structure and the characteristic area of the surrounding structure, these techniques can quantitatively analyze the effect of process parameters on the crystal structure.

【 授权许可】

Unknown