期刊论文详细信息
Electronics
A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation Environments
Yolanda Morilla1  Sergio Cuenca-Asensi2  Alejandro Serrano-Cases2  Antonio Martínez-Álvarez2  LeonardoMaria Reyneri3 
[1] Centro Nacional de Aceleradores (Universidad de Sevilla, CSIC, JA). Avda. Tomás Alba Edison 7, 41092 Sevilla, Spain;Department of Computer Technology, Ctra. San Vicente del Raspeig s/n, 03690 San Vicente del Raspeig, Spain;Department of Electronics, Politecnico di Torino, Corso Duca d. Abruzzi 24, 10129 Turin, Italy;
关键词: fault tolerance;    single event upset;    proton irradiation effects;    neutron irradiation effects;    soft errors;   
DOI  :  10.3390/electronics8060653
来源: DOAJ
【 摘 要 】

A high-level C++ hardening library is designed for the protection of critical software against the harmful effects of radiation environments that can damage systems. A mathematical and empirical model to predict system behavior in the presence of radiation induced faults is also presented. This model generates a quick evaluation and adjustment of several reliability vs. performance trade-offs, to optimize radiation hardening based on the proposed C++ hardening library. Several simulations and irradiation campaigns with protons and neutrons are used to build the model and to tune it. Finally, the effects of our hardening approach are compared with other hardened and non-hardened approaches.

【 授权许可】

Unknown   

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