An Investigation of SILAR Grown CdO Thin Films

Iranian Journal of Chemistry & Chemical Engineering

Karunakaran Marimuthu¹  Kasirajan Kasinathan¹  Rajini Murugesan¹  Maheswari Sathiah²  Chandramohan Rathinam³ 

[1] Department of Physics, Alagappa Government Arts College, Karaikudi – 630 003, INDIA;Department of Physics, Caussanel College of Arts and Science, Muthupettai – 623 523, INDIA;Department of Physics, Sri Sevugan Annamalai College, Devakottai – 630 303, INDIA;

关键词: cdo;    thin films;    xrd;    silar;    optical studies;   

DOI  :  

来源: DOAJ

【 摘 要 】

Cadmium oxide (CdO) thin films were deposited on the glass substrate by the modified SILAR method, using cadmium acetate dihydrate and ammonium hydroxide aqueous solution as precursors. The structural, surface morphological, elemental composition and optical properties of the deposited films were investigated via X-Ray Diffraction (XRD), scanning electron microscopy, EDAX, optical absorption, photoluminescence, and FT-IR spectroscopy. The XRD analysis reveals that the films were polycrystalline with cubic structure. Both crystallinity and grain size were found to increase with increasing solution concentration. The energy-dispersive spectroscopic analysis confirmed the presence of Cd and O elements. The films exhibited a maximum transmittance (50% - 70%) in the infra-red region. Transmittance was found to increase with increasing precursor concentration and estimated bandgap energy (Eg) was in the range of 2.17 – 2.21 eV.

【 授权许可】

Unknown