期刊论文详细信息
Journal of Synchrotron Radiation | |
Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector. Corrigendum | |
Matteo Pancaldi1  Flavio Capotondi1  Emanuele Pedersoli1  Dario De Angelis1  Marcel Hennes2  Boris Vodungbo2  Emmanuelle Jal2  Renaud Delaunay2  Cyril Léveillé3  Horia Popescu3  Kewin Desjardins3  Nicolas Jaouen3  | |
[1] Elettra-Sincrotrone Trieste, Basovizza, Trieste 34149, Italy;Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France;Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, BP48, 91192 Gif-sur-Yvette, France; | |
关键词: cmos; soft x-ray fel applications; single-shot experiment; time resolved; | |
DOI : 10.1107/S1600577522001370 | |
来源: DOAJ |
【 摘 要 】
The name of one of the authors in the article by Léveillé et al. [(2022), J. Synchrotron Rad. 29, 103–110] is corrected.
【 授权许可】
Unknown