Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector. Corrigendum

Journal of Synchrotron Radiation

Matteo Pancaldi¹  Flavio Capotondi¹  Emanuele Pedersoli¹  Dario De Angelis¹  Marcel Hennes²  Boris Vodungbo²  Emmanuelle Jal²  Renaud Delaunay²  Cyril Léveillé³  Horia Popescu³  Kewin Desjardins³  Nicolas Jaouen³ 

[1] Elettra-Sincrotrone Trieste, Basovizza, Trieste 34149, Italy;Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France;Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, BP48, 91192 Gif-sur-Yvette, France;

关键词: cmos;    soft x-ray fel applications;    single-shot experiment;    time resolved;   

DOI  :  10.1107/S1600577522001370

来源: DOAJ

【 摘 要 】

The name of one of the authors in the article by Léveillé et al. [(2022), J. Synchrotron Rad. 29, 103–110] is corrected.

【 授权许可】

Unknown