IEEE Photonics Journal | |
Breakthroughs in Photonics 2013: X-Ray Optics | |
Regina Soufli1  | |
[1] Lawrence Livermore National Laboratory, Livermore, CA, USA; | |
关键词: X-ray optics; multilayer interference coatings; metrology; EUV; X-ray applications; | |
DOI : 10.1109/JPHOT.2014.2309640 | |
来源: DOAJ |
【 摘 要 】
This review discusses the latest advances in extreme ultraviolet/X-ray optics development, which are motivated by the availability and demands of new X-ray sources and scientific and industrial applications. Among the breakthroughs highlighted are the following: i) fabrication, metrology, and mounting technologies for large-area optical substrates with improved figure, roughness, and focusing properties; ii) multilayer coatings with especially optimized layer properties, achieving improved reflectance, stability, and out-of-band suppression; and iii) nanodiffractive optics with improved efficiency and resolution.
【 授权许可】
Unknown