Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-in Thermography and Localized Segmentation

Applied Sciences

Haitao Zheng¹  Linghao Zhou¹  Ryan Marks¹  Thomas M. Kraft²  Tuomas Happonen² 

[1] The Welding Institute, Granta Park, Great Abington, Cambridge CB21 6AL, UK;VTT Technical Research Centre of Finland, Kaitoväylä 1, 90570 Oulu, Finland;

关键词: automated defect recognition;    roll-to-roll;    printing;    organic photovoltaic;    thin film;    non-destructive testing;   

DOI  :  10.3390/app12042005

来源: DOAJ

【 摘 要 】

The demand for flexible large area optoelectronic devices such as organic light-emitting diodes (OLEDs) and organic photovoltaics (OPVs) is growing. Roll-to-roll (R2R) printing enables cost-efficient industrial production of optoelectronic devices. The performance of electronic devices may significantly suffer from local electrical defects. The dark lock-in infrared thermography (DLIT) method is an effective non-destructive testing (NDT) tool to identify such defects as hot spots. In this study, a DLIT inspection system was applied to visualize the defects of R2R printed silver conductors on flexible plastic substrates. A two-stage automated defect recognition (ADR) methodology was proposed to detect and localize two types of typical electrical defects, which are caused by complete or partial breaks on the printed conductive wires, based on localized segmentation and thresholding methods.

【 授权许可】

Unknown