Charge accumulation on metal strip-detector sensors under ion beam irradiation: experiment and modeling

Âderna Fìzika ta Energetika

V. M. Pugatch¹  M. V. Makarets²  E. O. Petrenko² 

[1] Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine;Taras Shevchenko National University, Kyiv, Ukraine;

关键词: ion beams;    thin films;    secondary electron emission;    metal strip-detector;    modeling;   

DOI  :  

来源: DOAJ

【 摘 要 】

This paper presents the Monte-Carlo simulation of charged particles motion in aluminum film of several tens micrometers thickness, which is a sensor part of a strip-detector. It was considered that secondary electrons are generated by copper ions Cu++ with energy 5 - 25 keV. An elastic collisions with target atoms, atomic levels ionization and electron capture have been taken into account for the ions, and for the secondary electrons – elastic collisions with target atoms, atomic levels ionization, plasmons and phonons generation. The derived dependence of the charge accumulated by sensor on ion beam energy is matching experimental data.

【 授权许可】

Unknown