Nanoscale elastic strain mapping of polycrystalline materials

Materials Research Letters

Paul F. Rottmann¹  Kevin J. Hemker¹ 

[1] Johns Hopkins University;

关键词: Nanobeam electron diffraction;    strain measurement;    transmission electron microscopy;   

DOI  :  10.1080/21663831.2018.1436609

来源: DOAJ

【 摘 要 】

Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The $ \pm 2\sigma $ strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique.

【 授权许可】

Unknown