A Gamma process-based degradation testing of silicone encapsulant used in LED packaging

Polymer Testing

Mesfin Seid Ibrahim¹  Zhou Jing²  Miao Cai³  Ye Chen⁴  Jiajie Fan⁵ 

[1] Changzhou Institute of Technology Research for Solid State Lighting, Changzhou, 213161, China;College of Mechanical and Electrical Engineering, Hohai University, Changzhou, 213022, China;;Corresponding author. Institute of Future Lighting, Academy for Engineering &Technology, Fudan University, Shanghai, 200433, China;;Institute of Future Lighting, Academy for Engineering &

关键词: LED packaging;    Silicone encapsulant;    Lumen decay;    Color shift;    Gamma process;   

DOI  :  

来源: DOAJ

【 摘 要 】

Silicone encapsulant is widely used in light-emitting diode (LED) packaging because it offers high light transmittance, high refractive index, high thermal stability, and long lifetimes. However, it is extremely sensitive to moisture when the LED operates under high temperature and high humidity. In this study, constant moisture stress-accelerated degradation tests (CSADT) are designed with three different thermal stresses on silicone encapsulant, and its real lumen decay and color shift lifetimes are predicted by integrating the accelerated lifetime model with the Gamma process model considering the random effects of the degradation data. The results show that: (1) the lumen decay path after natural logarithmic transformation as well as the color shift degradation path can be well fitted with the linear model. In addition, the degradation rate is related to the thermal stress under the same humidity stress condition; (2) the Gamma process model has a high prediction accuracy when the lumen decay lifetime is used for estimation. On the contrary, the least squares regression (LSR) model has shown superior prediction accuracy versus the Gamma process model when color shift degradation data are used.

【 授权许可】

Unknown