A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Applied Sciences

Dominique Schreurs¹  Bart Nauwelaers¹  Ilja Ocket¹  Yan Liu²  Wei Zhao²  Hongbo Qin²  Hai Wang³  Xiaodong Yang⁴  Keming Feng⁵  Shengkang Zhang⁵  Song Liu⁵  Chunyue Cheng⁵ 

[1] Department of Electrical Engineering, University of Leuven, 3000 Leuven, Belgium;Key Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, China;School of Aerospace Science and Technology, Xidian University, Xi’an 710071, China;School of Electronic Engineering, Xidian University, Xi’an 710071, China;Science and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, China;

关键词: microwave measurement;    vector network analyzer (VNA);    calibration algorithm;    calibration standard;    on-wafer calibration;   

DOI  :  10.3390/app7090866

来源: DOAJ

【 摘 要 】

This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.

【 授权许可】

Unknown