期刊论文详细信息
| IEEE Journal of the Electron Devices Society | |
| Bipolar Resistive Switching Characteristics in Flexible Pt/MZT/Al Memory and Ni/NbO2/Ni Selector Structure | |
| Ke-Jing Lee1  Yeong-Her Wang1  Cheng-Jung Lee1  Yu-Chi Chang1  Li-Wen Wang1  | |
| [1] Department of Electrical Engineering, Institute of Microelectronics, National Cheng-Kung University, Tainan, Taiwan; | |
| 关键词: Bipolar resistive switching; flexible; memory; selector; sol-gel; | |
| DOI : 10.1109/JEDS.2018.2801278 | |
| 来源: DOAJ | |
【 摘 要 】
The use of a threshold-switching Ni/NbO2/Ni device with a memory-switching Pt/magnesium zirconate titanate/Al device on a flexible substrate was proposed to suppress undesired sneak currents. The proposed flexible one selector and one resistor (1S1R) memory device exhibits a low operation voltage, good ON/OFF ratio of 105, uniform current distribution, excellent flexibility, and stable I-V curve at 85 °C. The good selection and memory properties of the flexible 1S1R memory device are highly promising for high-density and low-power flexible electronic applications.
【 授权许可】
Unknown