Synthesis and Characterization of Molybdenum Back Contact Using Direct Current-Magnetron Sputtering for Thin Film Solar Cells

Frontiers in Materials

Habib M. Pathan¹  Sandesh R. Jadkar¹  Subhash M. Pandharkar¹  Sachin R. Rondiya²  Bharat B. Gabhale²  Avinash V. Rokade² 

[1] Department of Physics, Savitribai Phule Pune University, Pune, India;School of Energy Studies, Savitribai Phule Pune University, Pune, India;

关键词: Mo thin films;    DC sputtering;    XRD;    field emission scanning electron microscope;    UV-visible spectroscopy;   

DOI  :  10.3389/fmats.2018.00013

来源: DOAJ

【 摘 要 】

In present work, we report synthesis of molybdenum (Mo) thin films by direct current (DC)-magnetron sputtering method. The structural, optical, morphological, and electrical properties were investigated as a function of target-to-substrate distance. From the results, it is evident that with increase in target-to-substrate distance the thickness of films decreases while its sheet resistance and electrical resistivity increases, which is confirmed by van der Pauw method. Low angle XRD analysis revealed that with increase in target-to-substrate distance preferred orientation of Mo crystallites changes from (211) to (110) and its size decreases. The field emission scanning electron microscope (FE-SEM) analysis revealed a significant change in surface morphology with increase in target-to-substrate distance. UV-Visible spectroscopy analysis showed that Mo films deposited at higher target-to-substrate distance have more reflection than those deposited at lower target-to-substrate. Finally, adhesion test was performed using scotch hatch tape adhesion test which show all Mo films have excellent adhesion over the entire range of target-to-substrate distance studied. The employment of such Mo films as back contact can be useful to improve efficiency of CZTS solar cells.

【 授权许可】

Unknown