Single-Layer Resonant High Reflector in TE Polarization: Theory and Experiment

IEEE Photonics Journal

Kyu J. Lee¹  Robert Magnusson² 

[1] Department of Electrical Engineering, University of Texas at Arlington, Arlington, TX, USA;Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX, USA;

关键词: Engineered photonic nanostructures;    subwavelength structures;    gratings;    waveguide devices;   

DOI  :  10.1109/JPHOT.2011.2108645

来源: DOAJ

【 摘 要 】

We present the fabrication and characterization of a guided-mode resonance-based high reflector operating in transverse-electric (TE) polarization. This reflector consists of a single periodic layer of amorphous silicon on a glass substrate. It is fabricated by silicon sputtering, holographic interference patterning, and dry etching. The measured reflectance exceeds 90% over a ~ 130-nm wavelength range with maximum reflectance of ~ 98% in a band centered at a ~ 1560-nm wavelength. The experimental spectrum approximates the theoretical spectral response of this fundamental minimal device.

【 授权许可】

Unknown