Novel Radiation Hardened SOT-MRAM Read Circuit for Multi-Node Upset Tolerance

IEEE Open Journal of Nanotechnology

Seema Dhull¹  Alok Kumar Shukla¹  Sandeep Soni¹  Arshid Nisar¹  Namita Bindal¹  Brajesh Kumar Kaushik¹ 

[1] Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India;

关键词: Double node upset (DNU);    magnetic tunnel junction (MTJ);    radiation-hardened;    single event upset (SEU);    soft error;   

DOI  :  10.1109/OJNANO.2022.3181040

来源: DOAJ

【 摘 要 】

The rapid transistor scaling and threshold voltage reduction pose several challenges such as high leakage current and reliability issues. These challenges also make VLSI circuits more susceptible to soft-errors, particularly when subjected to harsh environmental conditions. Hybrid spintronic/CMOS technology has emerged as one of the promising techniques to achieve low leakage power and non-volatility. Moreover, the spintronic memories are inherently resistant to the radiation effects such as heavy-ion irradiation and total ionizing dose. However, its CMOS peripheral circuitry is more susceptible to radiation-induced single-event upset (SEU) and double-node upset (DNU). In this paper, a new radiation-hardened read circuit for SOT magnetic random access memory (MRAM) on 45nm technology has been presented. The proposed circuit is highly resistant to all the probable SEUs and DNUs when compared to the previously reported designs. The results show that it can tolerate 4.5X, 11X, 9X, and 10.5X more critical charge as compared to the cross-coupled CMOS transistor, 11T, 13T, and 11T radiation hardened circuits, respectively. Moreover, the recovery time of the proposed circuit is improved by 20% when compared to cross-coupled CMOS transistor circuits.

【 授权许可】

Unknown