Hyperspectral microscopy of two-dimensional semiconductors

Optical Materials: X

Armando Genco¹  Gianluca Valentini²  Xiaoyang Zhu²  Benedetto Ardini³  Qiuyang Li³  Cristian Manzoni³  Cristina Cruciano³  Giulio Cerullo³  Chiara Trovatello³ 

[1] Corresponding author.;Department of Chemistry, Columbia University, New York, NY, USA;Dipartimento di Fisica, Politecnico di Milano, Milano, Italy;

关键词: Transition metal dichalcogenides;    Hyperspectral imaging;    Photoluminescence;    Strain;    Machine vision;   

DOI  :  

来源: DOAJ

【 摘 要 】

Here we present an interferometric wide field hyperspectral microscope based on a common-path birefringent interferometer with translating wedges, to measure photoluminescence emission from two-dimensional semiconductors. We show diffraction-limited hyperspectral photoluminescence microscopy from two-dimensional materials across millimeter areas, proving that our hyperspectral microscope is a compact, stable and fast tool to characterize the optical properties and the morphology of 2D materials across ultralarge areas.

【 授权许可】

Unknown