Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers

卷:12

Sonil Nanda¹  Payman Ghassemi²  AymenAmine Assadi³  DinhDuc Nguyen⁴  Phuong Nguyen-Tri⁵  Pascal Carriere⁶ 

[1] Department of Chemical and Biological Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A2, Canada;

[2] Département de Chimie, Biochimie et Physique, Université du Québec à Trois-Rivières (UQTR), Trois-Rivières, QC G8Z 4M3, Canada;

[3] ENSCR—Institut des Sciences Chimiques de Rennes (ISCR)—UMR CNRS 6226, Univ Rennes, 35700 Rennes, France;

[4] Faculty of Environmental and Food Engineering, Nguyen Tat Thanh University, 300A Nguyen Tat Thanh, District 4, Ho Chi Minh City 755414, Vietnam;

[5] Institute of Research and Development, Duy Tan University, Da Nang 550000, Vietnam;

[6] Laboratoire MAPIEM (EA 4323), Matériaux Polymères Interfaces Environnement Marin, Université de Toulon, CEDEX 9, 83041 Toulon, France;

关键词: AFM-IR;    polymers;    polymer composites;    blends;    polymer aging;    nanoscale characterization;   

DOI  :  10.3390/polym12051142

来源: DOAJ

【 摘 要 】

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

【 授权许可】

Unknown