Noise-Based Simulation Technique for Circuit-Variability Analysis

IEEE Journal of the Electron Devices Society

卷:9

Benjamin Iniguez¹  Jakob Leise²  Jakob Pruefer²  Alexander Kloes²  Aristeidis Nikolaou²  Ghader Darbandy²  Ute Zschieschang³  Hagen Klauk³ 

[1] DEEEA, Universitat Rovira i Virgili, Tarragona, Spain;

[2] NanoP, TH Mittelhessen University of Applied Sciences, Giessen, Germany;

[3] Organic Electronics Deparment, Max Planck Institute for Solid State Research, Stuttgart, Germany;

关键词: Variability;    noise;    Monte Carlo analysis;    compact modeling;    verilog-A;    thin-film transistor;   

DOI  :  10.1109/JEDS.2020.3046301

来源: DOAJ

【 摘 要 】

An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time.

【 授权许可】

Unknown