期刊论文详细信息
| Advances in Physics: X | |
| Advances in ultrashallow doping of silicon | |
| Shannan Chang1  Yaping Dan1  Chufan Zhang1  | |
| [1] University of Michigan – Shanghai Jiao Tong University Joint Institute, Shanghai Jiao Tong University, Shanghai Chin; | |
| 关键词: Ultrashallow junctions; molecular monolayer doping; molecular beam epitaxy; ion implantation; sub-second thermal annealing; | |
| DOI : 10.1080/23746149.2020.1871407 | |
| 来源: Taylor & Francis | |
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【 摘 要 】
Ultrashallow doping is required for both classical field-effect transistors in integrated circuits and revolutionary quantum devices in quantum computing. In this review, we give a brief overview on recent research advances in three technologies to form ultrashallow doping, namely molecular monolayer doping, molecular beam epitaxy, and low energy ion implantation. A research perspective will be provided at the end of this review.
【 授权许可】
CC BY
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| RO202111265530457ZK.pdf | 7582KB |
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