Micro & nano letters | |
PSJ LDMOS with a VK dielectric layer | |
article | |
Lijuan Wu1  Yiqing Wu1  Bing Lei1  Yinyan Zhang1  Ye Huang1  Lin Zhu1  | |
[1] School of Physical and Electronic Science, Changsha University of Science and Technology | |
关键词: electric fields; charge compensation; silicon; semiconductor device breakdown; elemental semiconductors; silicon-on-insulator; MOSFET; semiconductor doping; buried layers; low-k dielectric thin films; VK dielectric layer; partial super junction lateral double-diffused metal–oxide–semiconductor field-effect transistor; PSJ VK LDMOS; low-resistance channel; enhanced dielectric layer field; high breakdown voltage; substrate-assisted depletion effect; charge compensation layer; lateral doping technique; PSJ SOI LDMOS; low-k material; low-k buried layer; lateral BV; figure of merit; FOM; drift region length; voltage 795.5 V; size 46.5 mum; Si; | |
DOI : 10.1049/mnl.2018.5467 | |
学科分类:计算机科学(综合) | |
来源: Wiley | |
【 摘 要 】
A partial super junction lateral double-diffused metal–oxide–semiconductor field-effect transistor with a variable- k dielectric layer (PSJ VK LDMOS) is proposed in this Letter. Low- k material and PSJ are introduced into the device. PSJ provides a low-resistance channel to reduce the specific on-resistance ( R on,sp ). Furthermore, according to an enhanced dielectric layer field, low- k buried layer can sustain the high breakdown voltage (BV). To eliminate substrate-assisted depletion effect and improve the lateral BV of the proposed structure, the charge compensation layer in the device adopts a variation of lateral doping technique and is combined with the N pillar in PSJ. Ultimately, the simulation results show that BV of 795.5 V and the figure of merit (FOM) of 6.1 MW cm −2 are achieved for PSJ VK LDMOS. BV and FOM are enhanced by 71.4 and 81.1%, respectively, compared with con. PSJ SOI LDMOS with the drift region length of 46.5 μm. Furthermore, R on,sp of 103.4 mΩ cm 2 is reduced by 31.2% compared with the ‘silicon limit’ at the same BV class, which breaks the ‘silicon limit’.
【 授权许可】
CC BY|CC BY-ND|CC BY-NC|CC BY-NC-ND
【 预 览 】
Files | Size | Format | View |
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RO202107100002782ZK.pdf | 1309KB | download |