Conduction mechanisms in metal/self-assembled monolayer/metal junctions

Micro & nano letters

article

David Etor¹  Linzi E. Dodd¹  Claudio Balocco¹  David Wood¹ 

[1] Department of Engineering, Durham University;Department of Electrical and Computer Engineering, Baze University;Department of Mathematics, Physics and Electrical Engineering, Northumbria University

关键词: MIM devices;    self-assembly;    tunnelling;    Poole-Frenkel effect;    Green's function methods;    monolayers;    MIM structures;    higher temperatures surface;    bulk-limited mechanisms;    direct (Simmons) tunnelling;    conduction mechanisms;    metal–insulator–metal junctions;    temperature dependence measurements;    metal-self-assembled monolayer-metal junctions;    temperature dependence;    surface-limited mechanisms;    Schottky emission;    Poole–Frenkel theory;    numerical simulations;    non-equilibrium Green-function formalism;    temperature 2.5 K to 300.0 K;   

DOI  :  10.1049/mnl.2018.5747

学科分类：计算机科学（综合）

来源: Wiley

【 摘 要 】

The conduction mechanisms in metal–insulator–metal junctions where the insulator consists of a self-assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface-limited and bulk-limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole–Frenkel theory. Further insight is gained through numerical simulations based on the non-equilibrium Green-function formalism.

【 授权许可】

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