Recent progress of graphene orientation determination technology based on scanning probe microscopy

Micro & nano letters

article

Yu Zhang¹  Guangjie Liu¹  Wenjing Xu¹ 

[1] Department of Computer Science and Technology, Changchun Normal University

关键词: crystal orientation;    nanoribbons;    scanning probe microscopy;    graphene;    integrated circuit manufacture;    graphene orientation determination technology;    scanning probe microscopy;    ideal chip material;    chip manufacturing;    electrical properties;    edge configurations;    graphene nanoribbons;    specific edge structures;    graphene crystal orientation detection methods;    scanning probe technology;    offline detection technology;    online detection technology;    detection technologies;    graphene orientation determination techniques;   

DOI  :  10.1049/mnl.2019.0782

学科分类：计算机科学（综合）

来源: Wiley

【 摘 要 】

Graphene is regarded as an excellent substitute for silicon and an ideal chip material for the next generation of chip manufacturing. Researches show that the electrical properties of graphene are closely related to its edge structures. Graphene can exhibit metal or semiconductive characteristics according to the different edge configurations. How to fabricate graphene nanoribbons with specific edge structures is the key premise for practical applications. The review highlights the new graphene crystal orientation detection methods based on scanning probe technology, including offline detection technology and online detection technology. The advantages and disadvantages of different detection technologies are analysed, and finally, a brief outlook for the development of graphene orientation determination techniques is given.

【 授权许可】

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