Determination of Hamaker constant for CNT and AFM probe configuration inside SEM

Micro & nano letters

article

Quan Yang¹ 

[1] School of Mechatronic Engineering and Automation, Shanghai University

关键词: atomic force microscopy;    van der Waals forces;    carbon nanotubes;    adhesion;    scanning electron microscopy;    cantilevers;    elasticity;    grippers;    gold;    integrated AFM–SEM;    AFM cantilever;    van der Waals adhesion force;    van der Waals attraction force;    robotic nanoscale manipulators system;    scanning electron microscope;    AFM–SEM-based method;    Hamaker constant determining experiment;    elastic force;   

DOI  :  10.1049/mnl.2020.0108

学科分类：计算机科学（综合）

来源: Wiley

【 摘 要 】

Mounting the atomic force microscope (AFM) probe on the gripper of the robotic nanoscale manipulators system enables the combination of the AFM and scanning electron microscope (SEM). The AFM–SEM-based method of determining Hamaker constant for carbon nanotube (CNT) and AFM cantilever in the vacuum condition of SEM, which is completed through a robotic nanoscale manipulators system, is presented for the first time. During Hamaker constant determining experiment, the elastic force is measured utilising integrated AFM–SEM imaging technique through detecting the deflection of AFM cantilever that actually equals van der Waals adhesion force. The van der Waals attraction force between CNT and AFM cantilever is calculated through the modelling of a cylindrical nanotube and a flat gold-coated surface. The experiment results indicate that Hamaker's constant measured are comparable to typical values published by previous researchers, being of the order of 100 zJ, which indicates that the present approach is valid and reliable.

【 授权许可】

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