DRPnet: automated particle picking in cryo-electron micrographs using deep regression

BMC Bioinformatics

Tommi A. White¹  Nguyen Phuoc Nguyen²  Filiz Bunyak²  Ilker Ersoy³  Jacob Gotberg⁴ 

[1] Department of Biochemistry, University of Missouri, Columbia, MO, USA;Electron Microscopy Core, University of Missouri, Columbia, MO, USA;Department of Electrical Engineering and Computer Science, University of Missouri, Columbia, MO, USA;Institute for Data Science and Informatics, University of Missouri, Columbia, MO, USA;Research Computing Support Services, University of Missouri, Columbia, MO, USA;

关键词: Convolutional neural network;    Regression;    Deep learning;    Electron microscopy;    Image segmentation;    Particle picking;    CryoEM;    Autopicking;    Single particle reconstruction;    Single particle analysis;    3D reconstruction;   

DOI  :  10.1186/s12859-020-03948-x

来源: Springer

【 授权许可】

CC BY