期刊论文详细信息
Applied Microscopy | |
Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images | |
Rolf Erni1  Feng Wang1  Trond R. Henninen1  Debora Keller1  | |
[1] Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstr. 129, CH-8600, Dübendorf, Switzerland; | |
关键词: Denoising; STEM images; Deep learning; Unsupervised learning; | |
DOI : 10.1186/s42649-020-00041-8 | |
来源: Springer | |