期刊论文详细信息
Applied Microscopy
Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images
Rolf Erni1  Feng Wang1  Trond R. Henninen1  Debora Keller1 
[1] Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstr. 129, CH-8600, Dübendorf, Switzerland;
关键词: Denoising;    STEM images;    Deep learning;    Unsupervised learning;   
DOI  :  10.1186/s42649-020-00041-8
来源: Springer
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