Characterization of growth sectors in synthetic quartz grown from cylindrical seeds parallel to [0001] direction

Materials Research

Pedro Luiz Guzzo²  Armando Hideki Shinohara²  Harlan Allen Dantas Costa²  Alberto Arnaldo Raslan¹  Carlos Kenichi Suzuki¹  Walter Mendes Azevedo¹ 

[1] ,Universidade Federal de Pernambuco Departamento de Engenharia Mecânica Recife PE ,Brazil

关键词: synthetic quartz;    impurity segregation;    infrared spectroscopy;    X-ray topography;   

DOI  :  10.1590/S1516-14392004000200011

来源: SciELO

【 摘 要 】

In the present study, the morphology and the impurity distribution were investigated in growth sectors formed around the [0001] axis of synthetic quartz crystals. Plates containing cylindrical holes and cylindrical bars parallel to [0001] were prepared by ultrasonic machining and further used as seed-crystals. The hydrothermal growth of synthetic quartz was carried out in a commercial autoclave under NaOH solution during 50 days. The morphologies of crystals grown from cylindrical seeds were characterized by X-ray diffraction topography. For both types of crystals, +X- and X- growth sectors were distinctly observed. Infrared spectroscopy and ionizing radiation were adopted to reveal the distribution of point defects related to Si-Al substitution and OH-species. It was found a different distribution of Al-related centers in relation to the crystals grown from conventional Y-bar and Z-plate seeds.

【 授权许可】

CC BY   
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