Characterization of multi-strip crystal deflector for high energy proton beams by synchrotron radiation topography with angular scanning

11th International Symposium on Radiation from Relativistic Electrons in Periodic Structures

Kaloyan, A.A.^1 ; Tikhomirov, S.A.^1 ; Podurets, K.M.^1 ; Chesnokov, Yu.A.^2 ; Sandomirskiy, Yu.E.^2

National Research Centre, Kurchatov Institute, Moscow

123182, Russia^1

Institute for High Energy Physics in National Research Centre, Kurchatov Institute, Protvino

142281, Russia^2

关键词: Angular scanning;    High energy proton beams;    Reflection modes;    Silicon single crystals;    Silicon strip;    Thick plate;    Twyman effect;    X-ray topography;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/732/1/012029/pdf
DOI  :  10.1088/1742-6596/732/1/012029

来源: IOP

【 摘 要 】

Currently, for extraction and collimation of proton beam at the large accelerators bent silicon single crystals are used. Recently the new device for multiple deflection of the proton beam was developed, it consists of several bent strips of silicon in the reflection mode. In the device the successive bending of silicon strips at the surface of a thick plate is achieved due to internal stresses in the material of the crystal due to the Twyman effect as a result of applying mechanical grooves. Method of X-ray topography at synchrotron radiation with angular scanning was applied for measurement of bending of the individual strips of the deflector and the crystal as a whole. The results of the measurement are compared with the results obtained in the proton beam.