Cerâmica | |
Direct probing of semiconductor barium titanate via electrostatic force microscopy | |
S. M. Gheno1  H. L. Hasegawa1  P. I. Paulin Filho1  | |
[1] ,Universidade Federal de S. Carlos Departamento de Engenharia de Materiais S. Carlos SP | |
关键词: electrostatic force microscopy; electric potential; barriers; barium titanate; microscopia de força eletrostática; potencial elétrico; barreiras; titanato de bário; | |
DOI : 10.1590/S0366-69132007000200015 | |
来源: SciELO | |
【 摘 要 】
Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm.
【 授权许可】
CC BY-NC
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