Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

Beilstein Journal of Nanotechnology

Aaron Mascaro^1¹ 

[1] Department of Physics, McGill University, 3600 rue University, Montreal, Québec H3A2T8, Canada^1

关键词: atomic force microscopy;    electrostatic force microscopy;    ionic transport;    lithium ion batteries;    nanotechnology;   

DOI  :  10.3762/bjnano.10.62

学科分类：地球科学(综合)

来源: Beilstein - Institut zur Foerderung der Chemischen Wissenschaften

【 摘 要 】

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

【 授权许可】

CC BY