Sensors | |
A Highly Sensitive CMOS Digital Hall Sensor for Low Magnetic Field Applications | |
Yue Xu1  Hong-Bin Pan1  Shu-Zhuan He1  | |
[1] School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China; E-Mails: | |
关键词: Hall sensor; CMOS technology; dynamic offset cancellation; chopped technique; | |
DOI : 10.3390/s120202162 | |
来源: mdpi | |
【 摘 要 】
Integrated CMOS Hall sensors have been widely used to measure magnetic fields. However, they are difficult to work with in a low magnetic field environment due to their low sensitivity and large offset. This paper describes a highly sensitive digital Hall sensor fabricated in 0.18 μm high voltage CMOS technology for low field applications. The sensor consists of a switched cross-shaped Hall plate and a novel signal conditioner. It effectively eliminates offset and low frequency 1/f noise by applying a dynamic quadrature offset cancellation technique. The measured results show the optimal Hall plate achieves a high current related sensitivity of about 310 V/AT. The whole sensor has a remarkable ability to measure a minimum ±2 mT magnetic field and output a digital Hall signal in a wide temperature range from −40 °C to 120 °C.
【 授权许可】
CC BY
© 2012 by the authors; licensee MDPI, Basel, Switzerland
【 预 览 】
Files | Size | Format | View |
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RO202003190045638ZK.pdf | 365KB | download |