A Highly Sensitive CMOS Digital Hall Sensor for Low Magnetic Field Applications

Sensors

Yue Xu¹  Hong-Bin Pan¹  Shu-Zhuan He¹ 

[1] School of Electronic Science & Engineering, Nanjing University, Nanjing 210093, China; E-Mails:

关键词: Hall sensor;    CMOS technology;    dynamic offset cancellation;    chopped technique;   

DOI  :  10.3390/s120202162

来源: mdpi

【 摘 要 】

Integrated CMOS Hall sensors have been widely used to measure magnetic fields. However, they are difficult to work with in a low magnetic field environment due to their low sensitivity and large offset. This paper describes a highly sensitive digital Hall sensor fabricated in 0.18 μm high voltage CMOS technology for low field applications. The sensor consists of a switched cross-shaped Hall plate and a novel signal conditioner. It effectively eliminates offset and low frequency 1/f noise by applying a dynamic quadrature offset cancellation technique. The measured results show the optimal Hall plate achieves a high current related sensitivity of about 310 V/AT. The whole sensor has a remarkable ability to measure a minimum ±2 mT magnetic field and output a digital Hall signal in a wide temperature range from −40 °C to 120 °C.

【 授权许可】

CC BY   
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