Frequency Noise Properties of Lasers for Interferometry in Nanometrology

Sensors

Jan Hrabina¹  Josef Lazar²  Miroslava Holá² 

[1] Institute of Scientific Instruments, v.v.i., Academy of Sciences of the Czech Republic, Královopolská 147, Brno 61264, Czech Republic;

关键词: nanometrology;    laser noise;    interferometry;    nanopositioning;    AFM;   

DOI  :  10.3390/s130202206

来源: mdpi

【 摘 要 】

In this contribution we focus on laser frequency noise properties and their influence on the interferometric displacement measurements. A setup for measurement of laser frequency noise is proposed and tested together with simultaneous measurement of fluctuations in displacement in the Michelson interferometer. Several laser sources, including traditional He-Ne and solid-state lasers, and their noise properties are evaluated and compared. The contribution of the laser frequency noise to the displacement measurement is discussed in the context of other sources of uncertainty associated with the interferometric setup, such as, mechanics, resolution of analog-to-digital conversion, frequency bandwidth of the detection chain, and variations of the refractive index of air.

【 授权许可】

CC BY   
© 2013 by the authors; licensee MDPI, Basel, Switzerland.