Crystals | |
Epitaxial Graphene and Graphene–Based Devices Studied by Electrical Scanning Probe Microscopy | |
Olga Kazakova1  Vishal Panchal1  | |
[1] National Physical Laboratory, Teddington TW11 0LW, UK; E-Mail: | |
关键词: epitaxial graphene; SiC; adsorbates; Kelvin Probe Force Microscopy (KPFM); Electrostatic Force Microscopy (EFM); surface potential; work function; wettability; | |
DOI : 10.3390/cryst3010191 | |
来源: mdpi | |
【 摘 要 】
We present local electrical characterization of epitaxial graphene grown on both Si- and C-faces of
【 授权许可】
CC BY
© 2013 by the authors; licensee MDPI, Basel, Switzerland.
【 预 览 】
Files | Size | Format | View |
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RO202003190037873ZK.pdf | 2023KB | download |