期刊论文详细信息
Coatings
Role of Cl on Diffusion of Cu in In2S3 Layers Prepared by Ion Layer Gas Reaction Method
Henry Wafula3  Musembi Robinson1  Albert Juma2  Thomas Sakwa3  Manasse Kitui3  Rodrigo Araoz2  Christian-H. Fischer2 
[1] Department of Physics, University of Nairobi, Nairobi-30197, Kenya; E-Mail:;Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany; E-Mails:;Physics Department, Masinde Muliro University of Science and Technology, Kakamega-50100, Kenya; E-Mails:
关键词: diffusion;    ILGAR;    In2S3;    CuSCN;   
DOI  :  10.3390/coatings5010054
来源: mdpi
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【 摘 要 】

Ion layer gas reaction (ILGAR) method allows for deposition of Cl-containing and Cl-free In2S3 layers from InCl3 and In(OCCH3CHOCCH3)3 precursor salts, respectively. A comparative study was performed to investigate the role of Cl on the diffusion of Cu from CuSCN source layer into ILGAR deposited In2S3 layers. The Cl concentration was varied between 7 and 14 at.% by varying deposition parameters. The activation energies and exponential pre-factors for Cu diffusion in Cl-containing samples were between 0.70 to 0.78 eV and between 6.0 × 10−6 and 3.2 × 10−5 cm2/s. The activation energy in Cl-free ILGAR In2S3 layers was about three times less compared to the Cl-containing In2S3, and the pre-exponential constant six orders of magnitude lower. These values were comparable to those obtained from thermally evaporated In2S3 layers. The residual Cl-occupies S sites in the In2S3 structure leading to non-stoichiometry and hence different diffusion mechanism for Cu compared to stoichiometric Cl-free layers.

【 授权许可】

CC BY   
© 2015 by the authors; licensee MDPI, Basel, Switzerland.

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