Crystals | |
Crystal Dislocations | |
Ronald W. Armstrong1  | |
[1] Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA | |
关键词: dislocations; crystals; polycrystals; nanopolycrystals; X-ray topography; transmission electron microscopy; optical microscopy; crystal growth; crystal strength properties; electrical properties; | |
DOI : 10.3390/cryst6010009 | |
来源: mdpi | |
【 摘 要 】
Crystal dislocations were invisible until the mid-20th century although their presence had been inferred; the atomic and molecular scale dimensions had prevented earlier discovery. Now they are normally known to be just about everywhere, for example, in the softest molecularly-bonded crystals as well as within the hardest covalently-bonded diamonds. The advent of advanced techniques of atomic-scale probing has facilitated modern observations of dislocations in every crystal structure-type, particularly by X-ray diffraction topography and transmission electron microscopy. The present Special Issue provides a flavor of their ubiquitous presences, their characterizations and, especially, their influence on mechanical and electrical properties.
【 授权许可】
CC BY
© 2016 by the authors; licensee MDPI, Basel, Switzerland.
【 预 览 】
Files | Size | Format | View |
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RO202003190000300ZK.pdf | 907KB | download |