NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE

Metrology and Measurement Systems

Andrzej Dziedzic¹  Zbigniew Zawiślak¹  Adam Witold Stadler¹ 

关键词: noise spectroscopy;    low-frequency noise;    resistance noise;    low-frequency noise measurement;    thick-film resistors;   

DOI  :  10.2478/mms-2014-0002

来源: Versita

【 摘 要 】

Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials.

【 授权许可】

Unknown