The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials

Journal of the Brazilian Chemical Society

Univ. Nac. de Córdoba, Córdoba, Argentina¹  Hernández Úbeda, M.¹  López Teijelo, M.¹  Maltz, A.¹  López de Mishima, B. A.¹  Univ. Nac. de Santiago del Estero, Santiago del Estero, Argentina¹  Zerbino, J.O.¹  Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas, La Plata, Argentina¹  Univ. Nac. de La Plata, La Plata, Argentina¹ 

关键词: ellipsometry;    manganese oxide;    anisotropy;   

DOI  :  10.1590/S0103-50531997000200005

学科分类：化学（综合）

来源: SciELO

【 摘 要 】

The galvanostatic electrodeposition of manganese dioxide films in the thickness range from 0 to 1000 nm was investigated by in situ ellipsometry. The results obtained can be fit into the whole thickness range in terms of the uniaxial anisotropy of the film. The optical indices and thicknesses were calculated. The anisotropic properties may be related to a preferential orientation of the deposits.

【 授权许可】

Unknown