Surface photocurrent nonuniformities in MSM detectors fabricated in gallium nitride heteroepitaxial layers

Optica Applicata

Bogdan Paszkiewicz¹  Marek Tlaczala¹  Regina Paszkiewicz¹  Adam Szyszka¹ 

关键词: metal–semiconductor–metal (MSM);    UV detector;    gallium nitride;    optical beam induced current (OBIC);    scanning surface potential microscopy (SSPM);   

DOI  :  

学科分类：光谱学

来源: Politechnika Wroclawska * Oficyna Wydawnicza / Wroclaw University of Technology

【 授权许可】

Unknown