Monitoring structural defects and crystallinity of carbon nanotubes in thin films

Pramana

A B Gaikwad¹  S S Mahajan¹  S P Gokhale1¹  M D Bambole¹ 

[1] Physical & Materials Chemistry Division, National Chemical Laboratory, Dr Homi Bhabha Road, Pune 411 008, India$$

关键词: Carbon nanotubes;    thin films;    chemical vapour deposition;    scanning electron microscopy;    Raman spectroscopy.;   

DOI  :  

学科分类：物理（综合）

来源: Indian Academy of Sciences

【 摘 要 】

We report the influence of catalyst formulation and reaction temperature on the formation of carbon nanotube (CNT) thin films by the chemical vapour deposition (CVD) method. Thin films of CNTs were grown on Fe–Mo/Al2O3-coated silicon wafer by thermal decomposition of methane at different temperatures ranging from 800 to 1000°C. The electron microscopic investigations, SEM as well as HRTEM, of the as-grown CNT thin films revealed the growth of uniform multi-walled CNTs in abundance. The intensity ratio of D-band to G-band and FWHM of G-band through Raman measurements clearly indicated the dependency of structural defects and crystallinity of CNTs in thin films on the catalyst formulation and CVD growth temperature. The results suggest that thin films of multi-walled CNTs with negligible amount of defects in the nanotube structure and very high crystallinity can be obtained by thermal CVD process at 925°C.

【 授权许可】

Unknown