期刊论文详细信息
IUCrJ
Application of X-ray topography to USSR and Russian space materials science
Prokhorov, I.A.1  Shul'pina, I.L.1  Bezbakh, I.Z.1  Serebryakov, Y.A.1 
关键词: X-RAY TOPOGRAPHY;    SPACE MATERIALS SCIENCE;    MICROGRAVITY;    SEMICONDUCTOR SINGLE CRYSTALS;    GROWTH STRIATIONS;    DEFECTS;    PHYSICAL MODELLING;    THERMOGRAVITATIONAL CONVECTION;   
DOI  :  10.1107/S2052252516003730
学科分类:数学(综合)
来源: International Union of Crystallography
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