Complex permittivity extraction from PCB stripline measurement using recessed probe launch

IEICE Electronics Express

Woocheon Park¹  Chulsoon Hwang²  Dong Gun Kam¹ 

[1] Department of Electronics Engineering, Ajou University;Global Technology Center, Samsung Electronics

关键词: complex permittivity;    dielectric constant;    loss tangent;    printed circuit board;    recessed probe launch;    stripline;   

DOI  :  10.1587/elex.12.20150023

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(7)A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20 MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.

【 授权许可】

Unknown