期刊论文详细信息
IEICE Electronics Express | |
Complex permittivity extraction from PCB stripline measurement using recessed probe launch | |
Woocheon Park1  Chulsoon Hwang2  Dong Gun Kam1  | |
[1] Department of Electronics Engineering, Ajou University;Global Technology Center, Samsung Electronics | |
关键词: complex permittivity; dielectric constant; loss tangent; printed circuit board; recessed probe launch; stripline; | |
DOI : 10.1587/elex.12.20150023 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(7)A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20 MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
---|---|---|---|
RO201911300896410ZK.pdf | 478KB | download |