A mixed sample-time error calibration technique in time-interleaved ADCs

IEICE Electronics Express

Chixiao Chen¹  Fan Ye¹  Junyan Ren¹  Bei Yu¹ 

[1] State Key Lab of ASIC and System, Fudan University

关键词: sample-time error;    analog-to-digital converter;    calibration;    time-interleaved;   

DOI  :  10.1587/elex.10.20130882

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(9)Cited-By(2)Sample-time error between channels degrades resolution of time-interleaved analog-to-digital converters (TIADCs). A calibration method implemented in mixed circuits with low-complexity and fast-convergence is proposed in this paper. The algorithm for detecting sample-time error, which is widely applied to wide-sense stationary input signals, is based on correlation. The detected sample-time error is corrected by a voltage-controlled sampling switch. Experimental result of a 2-channel 200-MS/s 14-bit TIADC shows that the signal-to-noise-and-distortion ratio improves 19.1dB, and the spurious-free dynamic range improves 34.6dB for a 70.12-MHz input after calibration. The convergence time of the calibration is about 20000 sampling intervals.

【 授权许可】

Unknown