A high-performance wear-leveling algorithm for flash memory system

IEICE Electronics Express

Ning-Mi Hsueh²  Ching-Che Chung²  Duo Sheng¹ 

[1] Department of Electrical Engineering, Fu Jen Catholic University;Department of Computer Science & Information Engineering, National Chung-Cheng University

关键词: NAND flash;    wear leveling;    garbage collection;   

DOI  :  10.1587/elex.9.1874

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(7)Cited-By(4)In this paper, a low-complexity high-performance wear-leveling algorithm which named sequential garbage collection (SGC) for flash memory system design is presented. The proposed SGC outperforms existing designs in terms of wear evenness and low design complexity. The lifetime of the flash memory can be greatly lengthened by the proposed SGC. The proposed SGC doesn’t require any tuning threshold parameter, and thus it can be applied to various systems without prior knowledge of the system environment for threshold tuning. Simulation results show that the maximum block erase count and standard deviation of the block erase count compared to the greedy algorithm are decreased by up to 75% and 94%, respectively.

【 授权许可】

Unknown