期刊论文详细信息
IEICE Electronics Express | |
Modeling and analysis of inter-symbol interference (ISI) jitter | |
Kyung Ki Kim1  | |
[1] Department of Electrical and Computer Engineering, Northeastern University | |
关键词: ISI jitter; timing jitter; serial data channel; | |
DOI : 10.1587/elex.4.582 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(7)This paper presents a novel modeling and analysis of inter-symbol interference (ISI)jitter in serial data channels either between chips or on chip. The simulation results show that ISI jitter is dependent on pole location, settling time, and damping ratio of the data serial channel. Based on the proposed ISI jitter model, the effect of the ISI jitter on other jitter components is illustrated along with realistic simulation results.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300452456ZK.pdf | 508KB | download |