Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm

IEICE Electronics Express

Peng Liu²  Weizheng Wang¹  Jishun Kuang²  Zhipeng Hu²  Zhiqiang You² 

[1] College of Computer and Communication Engineering, Changsha University of Science and Technology;College of Computer Science and Electronic Engineering, Hunan University

关键词: memristive crossbar;    RRAM;    DFT;    March algorithm;    logic operation;   

DOI  :  10.1587/elex.12.20150839

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(10)As an attractive option of future non-volatile memories (NVM), resistive random access memory (RRAM) has attracted more attentions. Due to its high density and low power, one memristor (1R) crossbar is a dominant RRAM structure. In this paper, we propose a logic operation-based design for testability (DFT) architecture for 1R crossbar testing. In this architecture, memristor-aided logic (MAGIC) NOR gates are embedded to check whether all the cells in the crossbar are 0 s or not at a time. A March-like test algorithm is also presented for the proposed architecture, which covers all modeled faults. The test time is reduced drastically with a little area overhead.

【 授权许可】

Unknown